Hioki BT6065, BT6075 PRECISION BATTERY TESTER
The Precision Battery Tester BT6065 and BT6075 are designed for OCV/AC-IR testing of high-capacity EV battery cells with low internal resistance. The extremely high resolution enables these models to perform advance cell-grading. These testers powerfully facilitate the creation of reliable and efficient OCV/IR testing systems with their innovative features and capability of high-speed testing.
Precision Battery Tester BT6065:
- In-line test of formation and aging process. OCV/AC-IR test for cell screening.
- Voltage display: 6-1/2 digits
- Max. DCV resolution: 10 µV
- Max. AC-IR resolution: 0.01 µΩ
Precision Battery Tester BT6075:
- Beginning- and end-of-line (BOL, EOL) test. For high-precision cell grading.
- Voltage display: 7-1/2 digits
- Max. DCV resolution: 1 µV
- Max. AC-IR resolution: 0.01 µΩ
We are GST registered in New Zealand and we charge in New Zealand Dollars. Foreign-based customers please email us or call our Australian or New Zealand numbers below and we can manually process the sale without New Zealand GST. For Australian customers we can also invoice in AUD and you can pay into our Australian bank account to minimise bank fees and complexities.
Please note that you may be assessed for your countries duties and taxes on import as per your local regulations.
- Description
Description
PRECISION BATTERY TESTER BT6065, BT6075
Precision OCV/IR testing for Next-gen High-capacity Battery
Overview
The Precision Battery Tester BT6065 and BT6075 are designed for OCV/AC-IR testing of high-capacity EV battery cells with low internal resistance. The extremely high resolution enables these models to perform advance cell-grading. These testers powerfully facilitate the creation of reliable and efficient OCV/IR testing systems with their innovative features and capability of high-speed testing.
Key Features
- Industry’s most accurate & high-speed OCV/IR test performance
- Shorter testing times while maintaining exceptional reproducibility
- Two testers work in tandem without interference
- Channel-specific correction and optional multiplexer
- Supports seamless setup of inspection systems
- High durability and long-term, stable test system operations
